| Key: | 1170 |
|---|---|
| Title: | X-Ray and Image Analysis in Electron Microscopy |
| Author: | Friel, John J. |
| Editor: | |
| Translator: | |
| Publisher: | Princeton Gamma-Tech |
| Doc type: | book |
| Copyright: | 1995 |
| Printed: | 1998 |
| LOC Call: | QH212.E4 F75 |
| Dewey Call: | |
| LCCN: | 94-067188 |
| ISBN: | 0-9641455-0-2 |
| Location: | attic - ref013 |
| Borrowed: | |
| Lent: | |
| Acquired: | gift |
| Acq on: | |
| Acq for: | |
| Notes: | Given to PGT employees. |
| Owner: | Greg Nelson |
| Own: | yes |
| Acq condition: | |
| Tag status: | marked |
| Have read: | part |